ASML YieldStar S-200B, Optical Overlay Metrology System, YoM2011
₹12,000,000.00
ASML S-200B YieldStar
Article number:
DV10125
Manufacturer:
ASML
Manufacturer number:
S-200B
Type:
YieldStar
YoM:
2011
Condition:
Used
Location
Germany
Availability:
immediately
Choose Quantity
Product Details
Advanced Semiconductor Materials Lithography Stand-alone Optical Overlay Metrology System for 300 mm Wafer, YieldStar S 200B
Model: S200B
Type: YieldStar
Year of manufacture: 2011
Technical data:
Wafer size: 300 mm (12")
Laser source: LPPS, water cooling
General:
The YSS200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.
Model: S200B
Type: YieldStar
Year of manufacture: 2011
Technical data:
Wafer size: 300 mm (12")
Laser source: LPPS, water cooling
General:
The YSS200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.
